Updating of the detector system applied to the customs inspection systems based on electron accelerators
The updating of the detector systems developed at NPK LUTS for application to customs inspection systems based on 6…10 MeV accelerators is considered. Tests of a new updated detector system applied in an industrial introscope based on a 15 MeV accelerator have demonstrated a wider range of thickne...
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| Date: | 2006 |
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| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
| Published: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2006
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| Series: | Вопросы атомной науки и техники |
| Subjects: | |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Updating of the detector system applied to the customs inspection systems based on electron accelerators / Yu.N. Gavrish, V.L. Novikov, A.V. Sidorov, A.M. Fialkovsky // Вопросы атомной науки и техники. — 2006. — № 2. — С. 154-156. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| Summary: | The updating of the detector systems developed at NPK LUTS for application to customs inspection systems
based on 6…10 MeV accelerators is considered. Tests of a new updated detector system applied in an industrial introscope
based on a 15 MeV accelerator have demonstrated a wider range of thickness of scanned (from 100…360
to 75…410 mm) objects at a resolution of 1-1T according to the radiographic ASTM standard. |
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