Microwave Determination Method of Thicknesses of Dielectric Materials Using a Beam Scanning Radiator
Possibilities of millimeter wavelength microwave metrology for determination of thicknesses of flat layers of nonmagnetic dielectric materials placed on a metal substrate or in free space are considered. As a radiator, a bilateral short-circuited fragment of dielectric waveguide with interconnecting...
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| Datum: | 2012 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | rus |
| Veröffentlicht: |
Видавничий дім «Академперіодика»
2012
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| Online Zugang: | http://rpra-journal.org.ua/index.php/ra/article/view/468 |
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| Назва журналу: | Radio physics and radio astronomy |