Influence of surface and intergrain boundaries scattering mechanisms of current carriers in thin films based on tin telluride

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Bibliographic Details
Date:2014
Main Authors: D. M. Freik, B. S. Dzundza, I. I. Chaviak, V. I. Makovyshyn, I. A. Arseniuk
Format: Article
Language:English
Published: 2014
Series:Physical surface engineering
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0001030978
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS