Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer

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Bibliographic Details
Date:2013
Main Authors: A. V. Sachenko, V. P. Kostylov, V. H. Lytovchenko, V. H. Popov, B. M. Romaniuk, V. V. Chernenko, V. M. Nasieka, T. V. Slusar, S. I. Kyrylova, F. F. Komarov
Format: Article
Language:English
Published: 2013
Series:Ukrainian Journal of Physics
Online Access:http://jnas.nbuv.gov.ua/article/UJRN-0000725395
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Journal Title:Library portal of National Academy of Sciences of Ukraine | LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS
id open-sciencenbuvgovua-87302
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spelling open-sciencenbuvgovua-873022024-04-16T18:57:17Z Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer A. V. Sachenko V. P. Kostylov V. H. Lytovchenko V. H. Popov B. M. Romaniuk V. V. Chernenko V. M. Nasieka T. V. Slusar S. I. Kyrylova F. F. Komarov 0372-400X 2013 en Ukrainian Journal of Physics http://jnas.nbuv.gov.ua/article/UJRN-0000725395 Article
institution Library portal of National Academy of Sciences of Ukraine | LibNAS
collection Open-Science
language English
series Ukrainian Journal of Physics
spellingShingle Ukrainian Journal of Physics
A. V. Sachenko
V. P. Kostylov
V. H. Lytovchenko
V. H. Popov
B. M. Romaniuk
V. V. Chernenko
V. M. Nasieka
T. V. Slusar
S. I. Kyrylova
F. F. Komarov
Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
format Article
author A. V. Sachenko
V. P. Kostylov
V. H. Lytovchenko
V. H. Popov
B. M. Romaniuk
V. V. Chernenko
V. M. Nasieka
T. V. Slusar
S. I. Kyrylova
F. F. Komarov
author_facet A. V. Sachenko
V. P. Kostylov
V. H. Lytovchenko
V. H. Popov
B. M. Romaniuk
V. V. Chernenko
V. M. Nasieka
T. V. Slusar
S. I. Kyrylova
F. F. Komarov
author_sort A. V. Sachenko
title Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
title_short Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
title_full Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
title_fullStr Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
title_full_unstemmed Recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
title_sort recombination characteristics of single-crystalline silicon wafers with a damaged near-surface layer
publishDate 2013
url http://jnas.nbuv.gov.ua/article/UJRN-0000725395
work_keys_str_mv AT avsachenko recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
AT vpkostylov recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
AT vhlytovchenko recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
AT vhpopov recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
AT bmromaniuk recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
AT vvchernenko recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
AT vmnasieka recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
AT tvslusar recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
AT sikyrylova recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
AT ffkomarov recombinationcharacteristicsofsinglecrystallinesiliconwaferswithadamagednearsurfacelayer
first_indexed 2024-04-17T06:14:13Z
last_indexed 2024-04-17T06:14:13Z
_version_ 1796886388445020160

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