Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements

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Bibliographische Detailangaben
Datum:	2012
1. Verfasser:	Yu. V. Gomeniuk
Format:	Artikel
Sprache:	English
Veröffentlicht:	2012
Schriftenreihe:	Semiconductor Physics, Quantum Electronics and Optoelectronics
Online Zugang:	http://jnas.nbuv.gov.ua/article/UJRN-0000350277
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Назва журналу:	Library portal of National Academy of Sciences of Ukraine \| LibNAS

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Library portal of National Academy of Sciences of Ukraine | LibNAS

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