Gaidar, G. P., Dolgolenko, A. P., & Litovchenko, P. G. (2011). The kinetic of point defect transformation during the annealing process in electron-irradiated silicon.
Chicago-Zitierstil (17. Ausg.)Gaidar, G. P., A. P. Dolgolenko, und P. G. Litovchenko. The Kinetic of Point Defect Transformation During the Annealing Process in Electron-irradiated Silicon. 2011.
MLA-Zitierstil (8. Ausg.)Gaidar, G. P., et al. The Kinetic of Point Defect Transformation During the Annealing Process in Electron-irradiated Silicon. 2011.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.