Мiкроструктура тонких композитних плiвок Si–Sn

Microstructure investigations of thin Si-Sn alloy films were carried out, by using Auger and Raman spectroscopies, X-ray fluorescence analysis, and electron microscopy. The films were produced by the thermal-vacuum coevaporation of Si and Sn. The properties of films with the Sn content ranging from...

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Bibliographic Details
Date:2018
Main Authors: Neimash, V. B., Poroshin, V. M., Kabaldin, A. M., Yukhymchuk, V. O., Shepelyavyi, P. E., Makara, V. A., Larkin, S. Yu.
Format: Article
Language:English
Ukrainian
Published: Publishing house "Academperiodika" 2018
Subjects:
Online Access:https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2018363
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Journal Title:Ukrainian Journal of Physics

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Ukrainian Journal of Physics