Optical properties, form of granules and electronic parameters of binary Al/Cr composites

von Shaykevich, I.A., Kolesnyk, P.V.
Veröffentlicht 2000

Spatial resolution of scanning tunneling microscopy

von Rozouvan, T., Poperenko, L., Shaykevich, I., Rozouvan, S.
Veröffentlicht 2015

Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique

von Rozouvan, T.S., Poperenko, L.V., Shaykevich, I.A.
Veröffentlicht 2015

Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation

von Shybiko, Ya.A., Shaykevich, I.A., Melnichenko, L.Yu.
Veröffentlicht 2006

Ellipsometric investigation of β-Si₃N₄ ceramics with Mo and Al additives

von Prokopets', V.M., Shaykevich, I.A., Robur, L.Y.
Veröffentlicht 2005

Optical properties of graphene film growing on a thin copper layer

von Rozouvan, T.S., Poperenko, L.V., Kravets, V.G., Shaykevich, I.A.
Veröffentlicht 2016

Influence of surface dimensional effects and interband transitions on absorption of light in aluminium

von Mеlnichenko, L.Yu., Tytarchuk, B.B., Shaykevich, I.A.
Veröffentlicht 2002

Determination of refractive index dispersion and thickness of thin antireflection films TiO₂ and Si₃N₄ on surfaces of silicon photoelectric converters

von Donets, V.V., Melnichenko, L.Y., Shaykevich, I.A., Lomakina, O.V.
Veröffentlicht 2009

Optical properties of thin films of titanium with transient layers on them

von Lendel, V.V., Lomakina, O.V., Mel’nychenko, L.Yu., Shaykevich, I.A.
Veröffentlicht 2010