Si as dopant impurity in CdTe
CdTe<Si> single crystals have been investigated by high-temperature Hall effect meas- urements under Cd vapor pressure in 200-900 ℃ temperature range. Basing on the experimental results, the Si solubility in CdTe at 500-600 ℃ has been supposed to be lower than ≈ 3*10¹⁶ at/cm . The Si segregati...
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| Datum: | 2005 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
НТК «Інститут монокристалів» НАН України
2005
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| Schriftenreihe: | Functional Materials |
| Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/139311 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Si as dopant impurity in CdTe / P.M. Fochuk, O.E. Panchuk // Functional Materials. — 2005. — Т. 12, № 4. — С. 771-774. — Бібліогр.: 8 назв. — англ. |