Si as dopant impurity in CdTe

CdTe<Si> single crystals have been investigated by high-temperature Hall effect meas- urements under Cd vapor pressure in 200-900 ℃ temperature range. Basing on the experimental results, the Si solubility in CdTe at 500-600 ℃ has been supposed to be lower than ≈ 3*10¹⁶ at/cm . The Si segregati...

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Bibliographic Details
Date:2005
Main Authors: Fochuk, P.M., Panchuk, O.E.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2005
Series:Functional Materials
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/139311
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Si as dopant impurity in CdTe / P.M. Fochuk, O.E. Panchuk // Functional Materials. — 2005. — Т. 12, № 4. — С. 771-774. — Бібліогр.: 8 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine