Дослiдження методами ІЧ-спектроскопiї тонких плiвок оксиду цинку, вирощених методом АПО

Using the IR reflection method and the modified method of disturbed total internal reflection (DTIR), thin undoped conducting ZnO films grown with the use of the atomic layer deposition method have been studied theoretically and experimentally for the first time in a spectral interval of 400–1400 cm...

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Bibliographic Details
Date:2019
Main Authors: Venger, E. F., Melnichuk, L. Yu., Melnichuk, A. V., Semikina, T. V.
Format: Article
Language:English
Ukrainian
Published: Publishing house "Academperiodika" 2019
Subjects:
Online Access:https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019006
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Journal Title:Ukrainian Journal of Physics

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Ukrainian Journal of Physics