Lashkaryov Institute of Semiconductor Physics NAS Ukraine — 50 years old

von V. F. Machulin
Veröffentlicht 2010

X-ray diffraction investigation of GaN layers on Si(111) and Al2O3(0001) substrates

von N. V. Safriuk, G. V. Stanchu, A. V. Kuchuk, V. P. Kladko, A. E. Belyaev, V. F. Machulin
Veröffentlicht 2013

X-ray diffraction study of deformation state in InGaN/GaN multilayered structures

von V. P. Kladko, A. V. Kuchuk, N. V. Safryuk, V. F. Machulin, A. E. Belyaev, R. V. Konakova, B. S. Yavich
Veröffentlicht 2010

Photochromic properties of composite films of thermally irreversible diarylethenes and fulgimides in polytetrafluoroethylene matrix

von O. I. Kobeleva, T. M. Valova, A. O. Ait, V. A. Barachevsky, K. P. Grytsenko, V. F. Machulin, M. M. Krayushkin
Veröffentlicht 2011

Basic physics of multiparameter crystallography: diagnostics of defects of several types in single-crystal materials and articles of nanotechnologies

von V. B. Molodkin, M. V. Kovalchuk, V. F. Machulin, Kh. Mukhamedzhanov, S. V. Lizunova, S. I. Olikhovskij, E. G. Len, B. V. Sheludchenko, S. V. Dmitriev, E. S. Skakunova, V. V. Molodkin, V. V. Lizunov, V. P. Kladko, E. V. Pervak
Veröffentlicht 2011