Showing 1 - 3 results of 3 for search 'Gamov, D. V.' Skip to content
VuFind
  • Your Account
  • Log Out
  • Login
  • Language
    • English
    • Deutsch
    • Українська
Advanced
  • Author
  • Gamov, D. V.
Showing 1 - 3 results of 3 for search 'Gamov, D. V.', query time: 0.01s Refine Results
  1. 1
    Formation of silicon nanoclusters in buried ultra-thin oxide layers
    Formation of silicon nanoclusters in buried ultra-thin oxide layers
    by Oberemok, O.S., Litovchenko, V.G., Gamov, D.V., Popov, V.G., Melnik, V.P., Gudymenko, O.Yo., Nikirin, V.A., Khatsevich, І.M.
    Published 2011
    Get full text
    Article
    Save to List
    Saved in:
  2. 2
    Strain relaxation in thin Si₁-ₓ-yGeₓCy layers on Si substrates
    Strain relaxation in thin Si₁-ₓ-yGeₓCy layers on Si substrates
    by Valakh, M.Ya., Gamov, D.V., Dzhagan, V.M., Lytvyn, O.S., Melnik, V.P., Romanjuk, B.M., Popov, V.G., Yukhymchuk, V.O.
    Published 2006
    Get full text
    Article
    Save to List
    Saved in:
  3. 3
    Дослiдження рекомбiнацiйних характеристик Cz-кремнiю, iмплантованого iонами залiза
    Дослiдження рекомбiнацiйних характеристик Cz-кремнiю, iмплантованого iонами залiза
    by Gamov, D. V., Gudymenko, O. I., Kladko, V. P., Litovchenko, V. G., Melnik, V. P., Oberemok, O. S., Popov, V. G., Polishchuk, Yu. O., Romaniuk, B. M., Chernenko, V. V., Nasekа, V. M.
    Published 2018
    Get full text
    Article
    Save to List
    Saved in:
Search Tools: RSS Feed – Email Search

Related Subjects

X-ray diffraction defects gettering iron lifetime mass spectrometry silicon гетерування дефекти залiзо кремнiй мас-спектрометрiя рентгенiвська дифрактометрiя час життя

Search Options

  • Search History
  • Advanced Search

Find More

  • Browse the Catalog
  • Browse Alphabetically
  • Explore Channels
  • New Items

Need Help?

  • Search Tips
  • Documentation

Statistics

Pdf Flag Counter