Borophosphosilicate glass component analysis using secondary neutral mass spectrometry

by Oberemok, O., Lytvyn, P.
Published 2002

AES and XPS characterization of TiN layers formed and modified by ion implantation

by Melnik, V., Popov, V., Kruger, D., Oberemok, O.
Published 1999

Ultrasound effect on radiation damages in boron implanted silicon

by Romanjuk, B., Krüger, D., Melnik, V., Popov, V., Olikh, Ya., Soroka, V., Oberemok, O.
Published 2000

Механiзми модифiкацiї профiлiв розподiлу домiшок при мас-спектрометричному аналiзi багатошарових наноструктур...

by Efremov, A. A., Litovchenko, V. G., Melnik, V. P., Oberemok, O. S., Popov, V. G., Romanyuk, B. M.
Published 2019

Influence of deposition rate and substrate temperature on structure and optical features of NiO thin film

by Oberemok, O.S., Sabov, T.M., Lisovskyy, I.P., Khacevych, I.M., Gudymenko, O.Yo., Nikirin, V.A., Voitovych, M.V.
Published 2016

Formation of silicon nanoclusters in buried ultra-thin oxide layers

by Oberemok, O.S., Litovchenko, V.G., Gamov, D.V., Popov, V.G., Melnik, V.P., Gudymenko, O.Yo., Nikirin, V.A., Khatsevich, І.M.
Published 2011

Light-induced mass transport in amorphous chalcogenides/gold nanoparticles composites

by Trunov, M.L., Lytvyn, P.M., Nagy, P.M., Oberemok, O.S., Durkot, M.O., Tarnaii, A.A., Prokopenko, I.V., Rubish, V.M.
Published 2013

Дослiдження рекомбiнацiйних характеристик Cz-кремнiю, iмплантованого iонами залiза

by Gamov, D. V., Gudymenko, O. I., Kladko, V. P., Litovchenko, V. G., Melnik, V. P., Oberemok, O. S., Popov, V. G., Polishchuk, Yu. O., Romaniuk, B. M., Chernenko, V. V., Nasekа, V. M.
Published 2018